SIC-150 shows excellent performance for removing static and dust from semiconductor and small electronic device. SIC-150 has an infrared ray sensor and produces ion automatically when the electrified body is in the chamber. Also, collecting device attaches/removes fine dust floating in the process, decreases defect rate remarkably, and is effective for cost saving on maintenance.
Key Features
- Chamber type Ion Nozzle
- Ion balance within ±20V
- Suitable for small parts and products static ionization
- Infrared ray sensor detects material inside the chamber and operates SIC-150
- Air filter applied(0.3㎛)
- Secondary contamination can be prevented via dust collecting unit
- Solves the problems of Small / narrow space cleanness & static elimination at the same time
Specifications
| Parameter | Description / Value | Remark |
|---|---|---|
| Input Power | AC 100 ~ 240V, 50/60Hz | |
| Power Consumption | 20W | |
| Current Consumption | 90mA | AC 220V |
| Ion-Generation Method | High Frequency AC | Piezo |
| Air Purge Supply Pressure | 0.1MPa ~ 0.5MPa | CDA(Clean Dry Air), N2 |
| Air Inlet | Ø6 | |
| Maximum Air Flow | 2.499m³/min | |
| Ion Balance | Within ±20V | |
| Operation Circumstance | 0°C ~ +50°C(32°F ~ 122°F), 35% ~ 85% RH | |
| Main Body Material | SUS 304 | |
| Electrode Material | Tungsten / Titanium | |
| Weight | 3.3kg | |
| Sensor | Photoelectric Sensor | |
| Alarm Function | High Voltage Abnormal Alarm | |
| Warranty | 1 year |
The appearance and specification of the product may be changed without prior notice for the improvement of the product.
Dimensions
